Hi Piash, I have attached a snapshot of a test bench that uses this concept. The inductor is in series with the voltage source and the current source used to probe the device impedance is applied to the device under test. The inductor is very large and hence blocks nearly all the AC current from passing through the DC voltage source. An AC analysis is performed and the impedance at a given frequency, fo, is determined from the impedance measured using the AC response and the current probe measurent. From that impedance at frequency fo, one can determine the capacitance and real part. The value of the DC voltage source is changed to compute the C-V characteristic of the device under test at the frequency fo. I hope this helps, Shawn![]()
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