Hi Marian, I’d do this by having two test benches - and then using the Specify Instances/Devices button on the bottom of the monte carlo form in ADE XL. You can then specify that you only want the mismatch to be applied to the specified instances (the instance names don’t have to match) in each test bench - and provided that it’s the same cellView, the mismatch should correlated. Setting correlation coefficients won’t help (and is unnecessary - and would be complicated anyway). To use the scatter plot capability, unfortunately it seems to be restricted to only measurements from the same test (I can’t really see a good reason for this other than historical). The good news is that it’s easy to workaround. Say I have a measurement on my first test (the test is called “DC”) called “DCoffset” then what I’d do is create a measurement on the second test also called “DCoffset” and set it to calcVal(“DCoffset” "DC”) . This means it will retrieve the value from the corresponding point in the other test, but because it’s in my transient test I can then use it in my scatter plot. I filed CCR 1848935 (against ADE Assembler) as I think this is a reasonable thing to want to do and I think we should make it possible without creating an artificial extra output. Regards, Andrew![]()
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